Influence of Parasitic Ghost Reflection on Measurement in a Heterodyne Interfe-Rometric Ellipsometer

邓元龙,李学金,柴金龙,徐刚
DOI: https://doi.org/10.3321/j.issn:1002-1582.2009.03.007
2009-01-01
Abstract:A heterodyne interferometric ellipsometer using a transverse Zeeman laser,with no moving parts,is investigated.The nonlinear error limits measurement accuracy at the nanometers level,which mainly results from the imperfections of laser sources and polarization optical components used.With Jones vector method,the model of the error produced by the parasitic ghost reflection is built;the influence of ghost reflection on error drift is discussed.The ghost reflection which arises from the same path with the same frequency as the original light beam has no contributes to the ellipsometric parameters' error;however whose arises from the cross-linking between the reference arm and the measurement arm with alternative frequency really produces an error at sub-nanometers of films thickness measurement.The methods of decreasing the influence of ghost reflection are discussed.
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