Study on Wide-range Device for High Precision Measurement

ZHOU Xiu-yun,CHENG Yu-hua
DOI: https://doi.org/10.16818/j.issn1001-5868.2009.06.039
2009-01-01
Abstract:To balance between environment and precision of large-scale metrology, a large-size measuring equipment that can be applied for industrial locales is introduced. The frequency-stabilized He-Ne laser with thermoregulation is used as the light source, which has the beat frequency about 790MHz and beat wavelength λ=412 μm. This length of integral multiple half beat wavelength is obtained by rough estimation. This mantissa length between the node and the close measuring point is measured with double frequency interferometer, which is combined in the same optical system. The test indicates that the device has a high environment adaptability and highest frequency difference stability among the same kind of great-size devices. The measuring accuracy is better than 30 μm/10 m and the measuring range is 0~20 m.
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