Abstract:This paper proposes a reactive magnetic near-field to far-field transformation method based on plane wave spectrum (PWS), aiming at electromagnetic radiation emission (RE) assessment at printed circuit board (PCB) level. Different from the antenna near-field measurement, the scanning plane is usually located in close vicinity of the device under test (DUT) in electromagnetic interference (EMI) near-field measurement, within the reactive region where evanescent waves are dominant. Additionally, in consideration of the presence of a ground plane on PCB, the tangential reactive electric near-field is minor, thus making it more common to measure the tangential reactive magnetic near-field. This further increases the difficulty of predicting far-field, which is commonly characterized by |E θ | and |E ϕ |. In this paper, the formula for magnetic near-field to far-field transformation is derived. Compared with the traditional dipole source reconstruction method, the proposed method eliminates the need for any intermediate steps and showcases an enhanced precision in predicting the far field of different examples. Additionally, the proposed method exhibits stronger robustness against noise interference, even in scenarios where the signal-to-noise (SNR) ratio is as low as 0 dB. Subsequently, numerical and experimental examples corroborate the effectiveness of the proposed mothed for reactive magnetic near-field to far-field transformation.

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