A High-Frequency and High Spatial Resolution Probe Design for EMI Prediction
Rui Yang,Xing-Chang Wei,Yu-Fei Shu,Yan-Bin Yang
DOI: https://doi.org/10.1109/tim.2018.2869181
IF: 5.6
2019-08-01
IEEE Transactions on Instrumentation and Measurement
Abstract:In this paper, a simple and accurate equivalent circuit of the magnetic probe is proposed. Based on the equivalent circuit, a high-frequency probe for near-field measurements is proposed, manufactured, and tested. To increase its working frequency, its parasitic inductance and capacitance are reduced by using a small loop aperture and a tapered transition. The working frequency of the probe is up to 30 GHz. At the same time, sidewall metallization and bottom-vias are used in the probe, which result in a good performance of electric field suppression. The transmission section of the probe is optimized at high frequencies by using via fence and coax-thru-hole vias. The magnetic field probe is built on a four-layered printed circuit board with Rogers substrate. The loop aperture size of the probe is $250,,mu ext{m},, imes 250,,mu ext{m}$ , so it has a high spatial resolution and is helpful to measure the detailed magnetic field from a small device. The probe is calibrated by a standard coplanar waveguide with a backside ground (CPWG). Finally, a near-field scanning system with the fabricated probe is set up to test the magnetic field above an unknown CPWG and microstrip line. From the near-field scanning results, it can be concluded that the probe can accurately measure the magnetic field over a wide frequency band.
engineering, electrical & electronic,instruments & instrumentation