Abstracts of MRS Internet Journal of Nitride Semiconductor Research, Volume 4, Articies 1–16
Yikyung Park,Byungki Kim,John A. Lee,O. H. Nam,Cheolsoo Sone,Hyun Park,Eunsoon Oh,Hyun‐Tae Shin,Seung‐Hoon Chae,J Cho,Ig-Hyeon Kim,Jinseok Khim,Soyun Cho,H. Marchand,N Zhang,Zhao Liu,Yuval Golan,Sabine Rosner,G. Girolami,P. Fini,J. P. Ibbetson,S. Keller,Steven P. DenBaars,James S. Speck,U. K. Mishra,J. Dalfors,Jack Bergman,Per-Olof Holtz,B. Ḿonemar,Hiroshi Amano,Isamu Akasaki,J.-I. Chyi,C.-M Lee,Chang‐Cheng Chuo,Gou-Chung Chi,G. Dang,Aihua Zhang,F. Ren,X. A. Cao,S. J. Pearton,S. N. G. Chu,R. G. Wilson,Janie Brown,Zhenxin Yu,John Matthews,S Hamey,J. Boney,J. F. Schetzina,John Benson,Khang Dang,C. W. Terrill,Thomas Nohava,Wenke Yang,Saneg Krishnankutty
DOI: https://doi.org/10.1557/s0883769400065118
IF: 5
2000-01-01
MRS Bulletin
Abstract:InGaN/GaN multi-quantum well (MQW) laser diodes (LDs) were grown on c-plane sapphire Substrates using a multi-wafer MOCVD System.The threshold current for pulsed lasing was 1.6 A for a gain-guided laser diode with a stripe of 10 x 800 pm 2 .The threshold current density was 20.3 kA cm 2 and the threshold voltage was 16.5 V.The optical power ratio of transverse electric mode to transverse magnetic mode was found to be greater than 50.The characteristic temperature measured from the plot of threshold current versus measurement temperature was between 130 and 150K.