Abstract:Abstract The objective of this article is to enhance a method for effectively discriminating light metallic materials from heavy ones at low X-ray energies. In this research, Monte Carlo simulations are employed to investigate the influential factors affecting material discrimination. Initially, for result validation, the experimental setup is fully simulated based on Monte Carlo method. The X-ray spectrum of 160 keV is simulated and then it is registered after interacting with step wedges made of iron, aluminum, graphite, and ABS at specific thicknesses, capturing the radiation flux at each step. The results are compared with the experimental findings obtained from a dual-layer detector, demonstrating excellent agreement. In practice, the dual-layer detector comprises a low-energy GOS detector, a copper filter, and a high-energy CsI(Tl) detector. The energy spectra of the registered X-rays on each layer of detectors are obtained using the Monte Carlo method. Materials with low, medium, and high atomic numbers are chosen for analysis. These materials are categorized into three groups: organic materials (comprising both light and heavy organic and biological substances), light metals, and heavy metals. Discrimination between materials is achieved independently of their thickness by utilizing a Material Classification Map (MCM) derived from a graph depicting the transmission ratio of low-energy X-ray photons versus the linear attenuation coefficient ratio for various materials with different atomic numbers. The results have been successfully validated through testing with various materials and thicknesses using both the experimental setup and Monte Carlo simulations.

Research on multi-spectrum detector in High-energy dual-energy X-ray imaging system

Multispectral Large-Panel X-ray Imaging Enabled by Stacked Metal Halide Scintillators

Material Discrimination Study of Dual-Energy Imaging Using Photon Counting Detector

Multi-energy Detection Using CdZnTe Semiconductor Detectors

Monte Carlo simulations of dual energy X-ray inspection systems

Material Classification Map Using Dual-Energy Method at Low-energy X-ray Spectrum: An Experimental and Monte-Carlo Simulation Study

Multi-energy X-ray Imaging Technique and Its Application in Computed Tomography

A Dynamic Material Discrimination Algorithm for Dual MV Energy X-ray Digital Radiography.

Design and fabrication of a sandwich detector for material discrimination and contrast cancellation in dual-energy based x-ray imaging

Multi-energy X-ray linear-array detector enabled by the side-illuminated metal halide scintillator

Quantitative Dual-Energy X-ray Imaging Based on K-Edge Absorption Difference

Overlapped Materials Decomposition in High-Energy Dual-Energy X-ray System

Study on X-ray security inspection technology based on multi-sensor detection

A Reconstruction Method for Dual High-Energy CT With MeV X-Rays

A Simulation Study on Basis Material Composition for Dual Energy Ct Imaging at High-Energy Level

Research on Dual energy Gas Detector and Its Calibration Method

Systematic Implementation of Spectral CT with a Photon Counting Detector for Liquid Security Inspection

Dual energy CT reconstruction method for incomplete high energy data

Overlapped Objects Discrimination Using Dual-Energy, High Energy X-ray Imaging

Dynamic-dual-energy spectral CT for improving multi-material decomposition in image-domain.

Dual-energy micro-CT with a dual-layer, dual-color, single-crystal scintillator