Overlapped Objects Discrimination Using Dual-Energy, High Energy X-ray Imaging

LI Qinghua,LI Jianmin,WANG Xuewu,ZHANG Li,KANG Kejun,ZHONG Huaqiang
DOI: https://doi.org/10.3321/j.issn:1000-0054.2008.08.008
2008-01-01
Abstract:A peeling off method was developed for the material discrimination technique with dual-energy,high energy X-rays(1~10 MeV) to improve the accuracy when inspected objects overlap.An α-curve model for material discrimination using X-rays with dual energies of 1~10 MeV was used to compare the α-curves before and after the overlap to reconstruct the α-curves of the overlapped objects.Tests were made on a full-scale prototype with X-ray boundary energies of 9 MeV and 6 MeV to discriminate overlapped objects and to calculate the discrimination accuracy.The results show that the method can be used to accurately identify the overlapped objects.
What problem does this paper attempt to address?