Infrared optical properties of BiFeO 3 thin films prepared by chemical solution deposition

Y.W. Li,J.Q. Xue,J.L. Sun,X.J. Meng,Z.M. Huang,J.H. Chu,L.H. Ding,W.F. Zhang
DOI: https://doi.org/10.1007/s00339-006-3855-y
2007-01-01
Abstract:BiFeO 3 thin films have been grown on Pt(111)/Ti/SiO 2 /Si substrates by chemical solution deposition. It is shown that the films are polycrystalline by the measurement of X-ray diffraction. The infrared optical properties of BiFeO 3 thin films have been investigated using the infrared spectroscopic ellipsometry in the wavelength range of 2.5 to 12.6 μm. The infrared optical constants of the BiFeO 3 thin films are obtained by fitting the measured ellipsometric spectra data using a three-medium model and a classical dielectric function model. The absorption coefficient of BiFeO 3 thin films is greater than 100 cm -1 in total measured wavelength region and greater than 1000 cm -1 at the wavelength region above 7.5 μm. It is bigger than that of PbTiO 3 , Pb(Zr,Ti)O 3 and (Pb,La)(Zr,Ti)O 3 thin films. It indicates that the BiFeO 3 thin films are excellent candidates for infrared detectors.
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