Abstract:The accurate assessment of switching losses is critical for evaluating the achievable performance of hard-switched applications implemented with wide band-gap semiconductors. The traditional method for evaluating the switching losses for a particular semiconductor device requires integrating the calculated instantaneous power waveform to compute switching energy loss. However, a potential problem arises due to the need to select limits of integration within the power waveform. While there are published standards designed to reduce the arbitrary nature of limit selection, not all device manufacturers subscribe to a single standard, and certain waveforms introduce ambiguity into the application of these standards. These factors compromise the ability to fairly assess and reliably compare performance between devices. To address this issue, the present paper proposes a switching loss estimation method based on Gaussian curve fitting that is not reliant on limit selection. The details of the proposed method are discussed herein, and results obtained from this method are compared to those from the published standards. As shown, this approach is simple and straightforward to implement, produces consistent results across a wide range of operating conditions and device types, and is especially suitable for automated post-processing of switching waveforms.

Switching loss analysis and modeling of power semiconductor devices base on an automatic measurement system

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