Ellipsometric Study of the Optical Properties of Silver Oxide Prepared by Reactive Magnetron Sputtering

JH Qiu,P Zhou,XY Gao,JN Yu,SY Wang,J Li,YX Zheng,YM Yang,QH Song,LY Chen
2005-01-01
Journal of the Korean Physical Society
Abstract:A series of AgOx thin films were prepared by the DC-magnetron reactive-sputtering method at room temperature under different sputtering power and oxygen to argon ratio conditions. The optical properties of the AgOx films were studied by analysis of the spectroscopic ellipsometry data with the Tauc-Lorentz multi-oscillator model in the 1.5 similar to 4.5-eV photon-energy range. The spectra of absorption, XPS and PL were measured. The results indicate that the AgOx film changes from metallic to dielectric structure with increasing oxygen flux. Under the saturated oxidation condition after annealing, the dominating component will be Ag2O in the film to show indirect interband transitions occurring at about 0.57 eV and 2.43 eV, respectively, that are in agreement with the results of PL measurement and Lorentz analysis.
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