Interface Magnetization Profiling By X-Ray Magnetometry Of Marker Impurities On Fe/Gaas(001)-(4x6)

Luca Giovanelli,Giancarlo C. Panaccione,Giorgio R. Rossi,Mauro Fabrizioli,Chuanshan Tian,Pedro Lana Gastelois,Jun Fujii,Christian Back
DOI: https://doi.org/10.1063/1.1995949
IF: 4
2005-01-01
Applied Physics Letters
Abstract:We use Co atoms dispersed in a ferromagnetic Fe film as a magnetic marker material to probe the magnetic properties of the Fe film grown epitaxially on GaAs(001)-(4x6). X-ray magnetic circular dichroism on Co L-2,L-3 edges has been used to perform, in a Mossbauer-like experiment, a layer-dependent analysis. We find an enhancement of the Co orbital magnetic moment near the interface with the GaAs substrate, as well as a decrease of the spin magnetic moment when approaching the interface and at the surface of the Fe film. (c) 2005 American Institute of Physics.
What problem does this paper attempt to address?