Investigation of dielectric and piezoelectric properties of (1-x)PST-xPZT relaxor ferroelectric ceramics

Dejun Lan,Dingquan Xiao,Yi Chen,Xi Le,Xiaoyan Yu,Jianguo Zhu
2005-01-01
Abstract:With high pure starting materials, the precursor ScTaO4 with wolframite structure was synthesized firstly, then by mixing the precursor with the other oxides, the (1-x)PST-xPb(Zr0.52Ti0.48O3) relaxor ferroelectrics ceramics (abbr. as PSTZT) were prepared by sintering from 1200 to 1300°C. The XRD analysis results demonstrated that the PSTZT ceramics were with pure perovskite structure. The temperature dependence of permittivity and dielectric loss of PSTZT ceramics were investigated in detail, which indicated that PSTZT ceramics showed a typical diffusive phase transition. The dielectric constant εr and the piezoelectric constant d33 of PSTZT ceramics increase with increase of the concentration of PZT and the sintering temperature. The impedance analysis showed that no clear crystal boundary phase existed in PSTZT ceramics. The piezoelectric properties dependent on the concentration of doped PZT in PSTZT ceramics were also investigated and discussed.
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