Review on epitaxial crystal growth on compliant substrate

Huang, F.Y.,Jiang, N.,Zeng, Y.P.
DOI: https://doi.org/10.1109/ICSICT.2004.1435275
2004-01-01
Abstract:We present a review on the growth and characterization of epitaxial semiconductor thin films, with a large lattice mismatch to Si, on nanometer thin silicon-on-insulator (SOI) compliant substrate. The first part is SiGe on SOI, and the second part is SiC on SOI. Some theoretical analysis for SiGe on SOI is also discussed.
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