Temperature Stability of the Central Wavelength for WDM Thin Film Bandpass Filters

顾培夫,陈海星,陆巍,白胜元,李海峰,章岳光,刘旭,唐晋发

DOI: https://doi.org/10.3321/j.issn:0253-2239.2004.01.008

2004-01-01

Abstract:The factors influenced central wavelength shift of wavelength division multiplexing (WDM) narrow-band filters are discussed. The temperature stability for such filters is emphasized. Based on Takashashi model, the effect of the temperature coefficient of refractive index, coefficient of linear expansion and Poisson ratio on temperature stability of the central wavelength of the filters is analyzed and calculated. The temperature coefficient of refractive index, linear expansion coefficient and Poisson ratio of the Ta2O5/SiO2 narrow-band filters are 1×10-5°C-1, 5×10-7°C-1 and 0.12 respectively. These three parameters are most important factors for the temperature stability of the filters, especially for the temperature coefficient of refractive index. For given substrate with certain linear expansion coefficient, the filter with a nearly zero wavelength shift is expected by means of adjusting interference order, cavity number and spacer material of the filters.