Temperature Stability of Thin Film Interleaver with Solid Cavity

Haixing Chen,Peifu Gu,Xu Liu,Weige Lu,Xiaoyun Qin
DOI: https://doi.org/10.1364/oic.2004.thd6
2004-01-01
Abstract:Analysis shows that the shift of center wavelength of interleaver is mainly caused by the temperature coefficient of the refractive index of cavity material, not the stress mismatch between solid cavity and thin film stack.
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