Growth of Single-Crystalline, Atomically Smooth MgO Films on Ge(001) by Molecular Beam Epitaxy
Wei Han,Yi Zhou,Yong Wang,Yan Li,Jared Wong,K. Pi,Adrian Swartz,Kathleen M. McCreary,Faxian Xiu,Kang L. Wang,Jin Zou,Roland Kawakami
DOI: https://doi.org/10.1016/j.jcrysgro.2009.09.052
IF: 1.8
2009-01-01
Journal of Crystal Growth
Abstract:We investigate the growth of MgO thin films on Ge(0 0 1) via molecular beam epitaxy and find that the growth temperature plays a key role in the quality of MgO thin films. Reflection high-energy electron diffraction (RHEED) and atomic force microscopy show that the single-crystal quality and atomically smooth morphology are optimized for a growth temperature of 250 °C. RHEED and transmission electron microscopy indicate that the MgO is (0 0 1) oriented and the MgO unit cell has a 45° in-plane rotation with respect to that of Ge, providing a high-quality film and interface for potential spin-injection experiments.