Abstract:As well-known,heteroepitaxial growth on sapphire is mainly employed to obtain optoelectronic(devices) because there is no suitable substrate matching with GaN.Therefore,the GaN layer suffers from a stress due to large difference in lattice constants and thermal expansion coefficients between the GaN and sapphire.To improve the quality of devices,the epitaxial lateral overgrowth(ELO) technique is applied to GaN.ELO-GaN on patterned SiO_2/GaN/α-Al_2O_3 substrate is grown by metalorganic chemical vapor deposition(MOCVD).First,a high quality 3 μm thick layer of GaN is grown by MOCVD.Next,standard deposition and photolithographic techniques are employed to prepare a set of parallel SiO_2 stripes oriented along a(〈11-00〉) GaN crystal direction separated by window areas which expose the underlying GaN.A second deposition of GaN onto this patterned substrate is then initiated.During the initial GaN growth,the SiO_2 stripes function as nonwettable surfaces and no GaN deposition occurs on them.However,once the GaN film growth from the window stripes reaches the tops of the SiO_2 stripes,epitaxial lateral overgrowth of GaN commences.The GaN thickness of the second step growth is about 10 μm.The results of a systematic study of the ELO-GaN on sapphire are reported.Atomic force microscopy(AFM) images showed that the surface of ELO-GaN is smooth and that there are linear-configuration hillocks in the middle of mask region,which are caused by the misorientation of crystalline when the ELO-GaN coalesce above the masks.The X-ray diffraction(XRD) curve revealed that the tilts in the(〈11-20〉) direction between GaN in window regions and mask regions are about 1.2°.Raman scattering spectrum revealed that the stress in the mask region is smaller than that in the window region and also the quality of GaN is much higher in the mask region.As a result,the quality of GaN crystalloid is effectively improved by MOCVD using the ELO technique.

Crystal Tilts in Epitaxially Laterally Overgrown GaN Films Determined by Four-Circle X-Ray Diffraction

Investigation of the Crystal Tilts in Laterally Epitaxial Overgrowth Gan Films Formed by Hydride Vapor Phase Epitaxy

Investigation on the origin of crystallographic tilt in lateral epitaxial overgrown GaN using selective etching

Structural Properties of Laterally Overgrown Gan

Influences of Mask Width, Fill Factor, HCl Addition and C Doping on Wing Tilts in the Epitaxial Laterally Overgrown GaN Films by Hydride Vapor Phase Epitaxy

Determination of the tilt and twist angles of curved GaN layers by high-resolution x-ray diffraction

Epitaxial Lateral Overgrowth of GaN with Chloride-Based Growth Chemistries in Both Hydride and Metalorganic Vapor Phase Epitaxy

Spatially Resolved and Orientation Dependent Raman Mapping of Epitaxial Lateral Overgrowth Nonpolar A-Plane GaN on R-Plane Sapphire.

Epitaxial Lateral Overgrowth Of Gan By Hvpe And Movpe

Structural Characterization of Epitaxial Lateral Overgrowth GaN by MOCVD

Investigation of crystallographic tilting in GaSb/GaAs heteroepitaxial structure by high-resolution X-ray diffraction

A Partly-Contacted Epitaxial Lateral Overgrowth Method Applied to GaN Material

Study of wing tilt in asymmetrically and laterally overgrowth of thick GaN films

Study of Epitaxial Lateral Overgrowth GaN by MOCVD

Epitaxial lateral overgrowth of GaN on molecular beam epitaxy GaN buffer layers on Si substrates by hydride vapour phase epitaxy

Depth-dependent Mosaic Tilt and Twist in GaN Epilayer: an Approximate Evaluation

Twist Angle of Mosaic Structure in GaN Films Determined by X-ray Diffraction

Epitaxial Lateral Overgrowth Of Gan On Si Substrates By Hydride Vapor Phase Epitaxy

Synthesis and Characterization of Heteroepitaxial Gan Films on Si(111)

High-resolution X-Ray Diffraction Studies of Highly Curved GaN Layers Prepared by Hydride Vapor Phase Epitaxy

Anisotropic structural characteristics of GaN templates and coalesced epitaxial lateral overgrown films deposited on sapphire