Grain Growth in Co27pt73 Alloy Films with Perpendicular Magnetic Anisotropy

K Xun,DF Shen
DOI: https://doi.org/10.1063/1.1372370
IF: 2.877
2001-01-01
Journal of Applied Physics
Abstract:The grain size of Co27Pt73 alloy films as-deposited and annealed at 250 °C has been studied by transmission electron microscopy (TEM) and x-ray diffraction. The grain size was found to increase from 4–8 to 20–35 nm when the thickness of the films changed from 7 to 49 nm, while the magnetic anisotropy constants of the films increased from 0.048 to 0.28 MJ/m3. The grain size increase was found to be independent of the growth time, but dependent on the film thickness. Significant stress in the Co27Pt73 alloy films was revealed by the difference between the grain sizes determined by the Scherrer equation and TEM. Evidence and analysis indicate that the local anisotropy structure resulting in perpendicular magnetic anisotropy in CoxPt1−x (x≈0.25) alloy films may be stable at 250 °C.
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