Microstructural Characterization of CoAg Granular Films

JH Du,WJ Liu,Q Li,H Sang,SY Zhang,YW Du,D Feng

DOI: https://doi.org/10.1016/s0304-8853(98)00238-8

IF: 3.097

1999-01-01

Journal of Magnetism and Magnetic Materials

Abstract:A series of ion-beam cosputtered CoAg granular films with 22 at% cobalt content, annealed at different temperatures (400–700K), have been characterized by X-ray diffraction and high-resolution electron microscopy. These films form with individual columnar grains. Following effects have occurred for the granular films upon annealing: phase separation progressed and roughly completed, while the grain growth is not obvious amorphous area has decreased in the sample annealed at 700K. In term of the giant magnetoresistance exhibited by these films, these observations mean that fine difference in microstructures can lead to the obvious change of the GMR behavior in the granular film.