Study of Oxide Scale on Ti-base Alloys by XPS and In-situ AES Techniques

封向东,祖小涛,王治国,林理彬,李燕伶,黄新泉

DOI: https://doi.org/10.3969/j.issn.0258-0926.2001.06.006

2001-01-01

Abstract:The oxide scale on Ti-base alloys in pH9 water at 300°C was investigated by X-Ray Diffraction (XRD), X-Ray Photoelectron Spectrometry (XPS) and in-situ Auger Electron Spectroscopy (AES) techniques. The XPS result showed that the chemical state of titanium changed with the depth: Ti4+ appeared near the surface of the oxide scale. As the depth increased, Ti3+(Ti2O3) and Ti2+(TiO) appeared. At first the percentages of Ti3+ was more than Ti2+, then there was more Ti2+ than Ti3+ when the depth was increased. The XRD spectroscopy and In-situ AES technique showed that the oxide scale formed on Ti-base alloys was composed of Al2TiO5, TiO2, Ti3O5,Ti2O3, Al2O3 and TiO. The depth profiles obtained by AES showed that the flat part appeared at the first part of the profile near the surface, and revealed that a stable layer of brookite (TiO2) was formed. The compact thick 5000Å scale with the mixture of brookite-TiO2 and Al2TiO5 was formed near the surface, and the total thickness of oxide scale was about 30000Å.