Switching Kinetics of Interface States in Deep Submicrometre Soi N-Mosfets

Y Shi,HM Bu,XL Yuan,SL Gu,B Shen,P Han,R Zhang,YD Zheng
DOI: https://doi.org/10.1088/0268-1242/16/1/304
IF: 2.048
2000-01-01
Semiconductor Science and Technology
Abstract:Switching kinetics characteristics of interface traps in deep-submicrometre SOI n-MOSFETs have been investigated by random telegraph signals (RTSs). Two different types of behaviour of noising centres, Coulomb-attractive and Coulomb-repulsive centres, have been observed. By studying the gate bias and temperature dependence of the transition time and amplitude of the RTSs caused by the noising centres, it has been demonstrated experimentally that a thermally activated process may dominate for Coulomb-repulsive centres, while quantum mechanical tunnelling is a favoured process for Coulomb-attractive centres. In particular, RTSs with very large amplitude (>60%), which are almost independent of measurement temperature and gate bias, are observed in an ultra-narrow channel, which is well described by the quantum tunnelling model.
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