Fabrication Of Micro Tunneling Magnetometer And On-Wafer Test

Jh Zhu,Zy Zhou,Hg Ding,Xy Ye
2001-01-01
Abstract:A novel micro magnetometer based on electron tunneling is presented. It utilizes the high sensitivity nature of electron tunneling effect, so it's expected to have very high resolution. The sensor is fabricated using silicon-glass bonding process. In order to determine the characteristics of the sensor, plates similar to the functional structure of the magnetometer are fabricated on the same wafer to determine the mechanical properties of the thin film (on-wafer test). A new resonance method to measure the residual stress is also presented.
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