Simple and Convenient Nonoptical Shear Force Sensor for Shear Force and Near-Field Optical Microscopes

Y Bai,JD White,G Zhang,G Chen,X Hou
DOI: https://doi.org/10.1063/1.125131
IF: 4
1999-01-01
Applied Physics Letters
Abstract:A simple, compact, and inexpensive method for shear force distance regulation is presented. A single piezoelectric cantilever is employed to both dither a fiber probe and to detect the decrease in piezotension-induced voltage as it approaches the sample surface. On resonance, the large piezotension-induced voltage (∼0.2 mV/nm) allows for simple electronics to be used. It is expected to find application both in shear force microscopy and for shear force distance regulation in near-field optical microscopy.
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