Abstract:We present a transmission, fluorescence, and polarization near-field scanning optical microscope with shear-force feedback control that is small in size and simple to operate. This microscope features an ultrafine mechanical tip/sample approach with continuous manual submicron control over a range of several millimeters. The piezo-driven 12 μm x-y scan range is complimented by a 4 mm coarse mechanical translation range in each direction. The construction materials used in the mechanical feedback loop have been carefully chosen for thermal compatibility in order to reduce differential expansion and contraction between the tip and sample. A unique pressure-fit sample mount allows for quick and reliable sample exchange. Shear-force feedback light is delivered to the scan head via an optical fiber so that a remote laser of any type may be used as a source. This dither light is collimated and refocused onto the tip, delivering a consistently small spot which is collected by a high numerical aperture objective. This new scan head incorporates an optical system which will permit the linearization of scan piezo response similar to a scheme used successfully with atomic force microscopy. This is designed to both overcome the piezo’s inherent hysteresis and to eliminate drift during long duration spatial scans or spectroscopic measurements at a single location. The scan head design offers added flexibility due to the use of optical fibers to deliver the dither and scan linearization light, and functions in any orientation for use in conjunction with upright or inverted optical microscopes.

A NONOPTICAL SHEAR-FORCE METHOD FOR TIP-SAMPLE DISTANCE REGULATION

A Novel Non-Optical Method of Tip-Sample Distance Regulation Based on Shear Force in Scanning Near-Field Optical Microscopy

A novel ultrasonic resonance sample-tip distance regulation for near field optical microscopy and shear force microscopy

Simple and Convenient Nonoptical Shear Force Sensor for Shear Force and Near-Field Optical Microscopes

Improvement and Application of Scanning Near Field Optical Microscope Based on A Piezoelectric Bimorph Shear Force Beam

Shear force scanning near-field optical microscope based on a piezoelectric bimorph cantilever

Detection of Shear Force with a Piezoelectric Bimorph Cantilever for Scanning Near‐field Optical Microscopy

The Height Regulation of a Near-Field Scanning Optical Microscope Probe Tip.

Mechanism for Shear-force Between Tip and Sample in NSOM and TSM

A New Method on Distance Control in Near-Field Scanning O ptical Microscopy

Dynamic Behavior of Tuning Fork Shear-Force Structures in a SNOM System

Active Bimorph-Based Tapping-Mode Distance Control for Scanning Near-Field Optical Microscopy of Biological Samples in Liquid

Ultrasonic resonance regulated near-field scanning optical microscope and laser induced near-field optical-force interaction

Tip-Scanning Dynamic Force Microscope Using Piezoelectric Cantilever for Full Wafer Inspection

Fractionized Calibration of the Sample Stage Used in an AFM-probe Mechanical Testing System

The influence of humidity on the shear force between tip and sample in NSOM using piezoelectric fork

A Probe-Based Nanometric Morphology Measurement System Using Intermittent-Contact Mode

A compact fluorescence and polarization near-field scanning optical microscope

Compact fiber optical interferometer technique to measure picometer displacements in biological piezoelectric materials

Shear Force Detection Using Single-Tine Oscillating Tuning Fork for Scanning Near-Field Optical Microscopy

Scanning near-field optical/spectrofluoro microscopy for operation in liquids