Measurement And Analysis Of The Optical Parameters Of Two Type Dye Films

jinyan li,Fuxi Gan,,Donghong Gu,Xiaodong Tang

DOI: https://doi.org/10.1117/12.318498

1998-01-01

Abstract:The optical parameters of two type vacuum sublimed vanadium Oxide phthalocyanine (VOPc) thin firm samples were measured by a Spectroscopic ellipsometer system. The results were obtained over the spectral from 270nm to 1700nm, and the thickness of each VOPc film was determined.

What problem does this paper attempt to address?

APPLICATION AND OPTICAL PROPERTIES OF TiO_2 THINFILMS PREPARED BY CHEMICAL VAPOUR DEPOSITION

Qing Guo,Zheng Wu

1999-01-01

Abstract:The optical properties are presented for TiO_2 thin films preparedby atmosphere chemical vapour deposition (CVD) using TiC1_4, such astransmittance, refractive index, extinction coefticient and optical band gapdetermined by UV measurement. It is found that TiO_2 thin films deposited attemperatures in the range of 100～250℃ using different gas flowratios(N_2+H_2O: N_2+TiCI_4) have refractive index varied in the range of2.16～2.82, extinction coefficient of 0.04×10~-3～6.70×10~-3 and optical bandgap of 2.8～3.08 eV. The TiO_2 films have been used to dispose phenolsolution photocatalytically, the conversion rate of phenol is up to 54.05%.
Determination of the optical constants of polymer light-emitting diode films from single reflection measurements

Dexi Zhu,Weidong Shen,Hui Ye,Xu Liu,Hongyu Zhen

DOI: https://doi.org/10.1088/0022-3727/41/23/235104

2008-01-01

Abstract:We present a simple and fast method to determine the optical constant and physical thickness of polymer films from a single reflectivity measurement. A self-consistent dispersion formula of the Forouhi-Bloomer model was introduced to fit the measured spectral curves by a modified 'Downhill' simplex algorithm. Four widely used polymer light-emitting diodes materials: poly[2-methoxy-5-(2'-ethyl-hexyloxy)-1,4-phenylenevinylene], poly(9,9-dioctylfluoreny-2,7-diyl) (PFO), poly(N-vinyl carbazole) and poly(3,4-ethylene dioxythiophene) : poly(styrenesulfonate) were investigated by this technique. The refractive indices over the whole visible region as well as the optical band gap extracted by this method agree well with those reported in the literature. The determined physical thicknesses present a deviation less than 4% compared with the experimental values measured by the stylus profiler. The influence of scattering loss on the fitted results is discussed to demonstrate the applicability of this technology for polymer films.
The Research of a Method to Obtain the Optical Parameters of Semiconductor Films

LIU Yong,SONG Chen-lu,WANG Jian-xun,HAN Gao-rong

DOI: https://doi.org/10.3321/j.issn:1002-1582.2005.06.013

2005-01-01

Abstract:It is very important for preparation and application of films to easily measure their optical parameters.A method to obtain the films' optical parameters from its reflection and transmission spectra was presented by using the Forouhi-Bloomer dispersion relation to describe the optical parameters of semiconductor films.The roughness of films was considered,and films thickness distribution was assumed to be normal distribution.Simulated annealing method and iteration method were combined to calculate the optical parameters.For instance,three silicate films sample are calculated and results of films' thickness are agreement with the spectroscopic ellipsometry results.This method is valuable for semiconductor films optical research work in practices.
THE THERMAL OPTICAL PROPERTIES OF POLY (METHYL METHACRYLATE) SOLID FILMS DOPED BY AZO DYES

翟剑峰,邱玲,周家云,赵榆霞,沈玉全,凌启淡,杨慕杰

IF: 0.6

2001-01-01

ACTA PHOTONICA SINICA

Abstract:The measurements of thermal optical coefficient (TOC) for organicdye doped polymer films using Abbé refractometer was demonstrated;A refractive index contrast necessary for forming waveguide has been achieved easily by adding higher refractive index material to a blank polyer.Based on the measurements of TOC,a novel approach for determining volume thermal expansion coefficient (TEC) of polymer films has been suggested.
Optical recording performance of thin films of phthalocyanine compounds

Donghong Gu,Qiying Chen,Juping Shu,Xiaodong Tang,Fuxi Gan,Shuyin Shen,Kai Liu,Huijun Xu

DOI: https://doi.org/10.1016/0040-6090(94)06327-3

IF: 2.1

1995-01-01

Thin Solid Films

Abstract:As organic dyes with excellent thermal and light stability, phthalocyanine compounds have been investigated as write-once read-many optical recording materials. By selecting different substituents and metallic ions, the absorption bands of thin film of phthalocyanine compounds were matched with the wavelengths of semiconductor lasers. It was found that the absorption regions of vacuum sublimated thin films of vanadyl phthalocyanine (VOPc), tetra-pentyloxy phthalocyanine vanadyl (TPPcVO) and tetra-nonyloxy phthalocyanine vanadyl (TNPcVO) were between 580 and 850 nm. In the near-IR region, the absorbance and reflectivity of thin films of VOPc were greater than 50%, and 20% respectively. The static optical recording test of the VOPc thin film showed that the write power was less than 10 mW with the write pulse width of 200 ns using an I-Ie-Ne laser as light source. The dynamic optical recording test of VOPc as a write-once read-many recording material on a 5.25 in optical disk indicated that the carrier-to-noise ratio (CNR) was greater than 45 dB.
MEASUREMENT OF OPTICAL PARAMETERS OF PHTHALOCYANINE LB FILMS AND SPIN-COATED FILMS

Zhengtian Gu,Jinlong Yin,Peihui Liang,Fuxi Gan

2000-01-01

Abstract:The LB films and spin-coated films of tetra-neopentoxy phthalocyanine zinc wereprepared and annealed at different temperatures.Their refractive index (n) and extinction coefficient k were measured by p-polarized reflectance.The similar value of n and k,as well as the similar changing trend with the varied annealing temperatures,was found between LB films and spincoated films.The experimental results coincide well with the theoretical analysis.
On the Optical Properties of Thin‐Film Vanadium Dioxide from the Visible to the Far Infrared

Chenghao Wan,Zhen Zhang,David Woolf,Colin M. Hessel,Jura Rensberg,Joel M. Hensley,Yuzhe Xiao,Alireza Shahsafi,Jad Salman,Steffen Richter,Yifei Sun,M. Mumtaz Qazilbash,Rüdiger Schmidt‐Grund,Carsten Ronning,Shriram Ramanathan,Mikhail A. Kats

DOI: https://doi.org/10.1002/andp.201900188

2019-08-20

Annalen der Physik

Abstract:The insulator‐to‐metal transition (IMT) in vanadium dioxide (VO2) can enable a variety of optics applications, including switching and modulation, optical limiting, and tuning of optical resonators. Despite the widespread interest in VO2 for optics, the wavelength‐dependent optical properties across its IMT are scattered throughout the literature, are sometimes contradictory, and are not available at all in some wavelength regions. Here, the complex refractive index of VO2 thin films across the IMT is characterized for free‐space wavelengths from 300 nm to 30 µm, using broadband spectroscopic ellipsometry, reflection spectroscopy, and the application of effective‐medium theory. VO2 films of different thicknesses are studied, on two different substrates (silicon and sapphire), and grown using different synthesis methods (sputtering and sol–gel). While there are differences in the optical properties of VO2 synthesized under different conditions, these differences are surprisingly small in the ≈2–11 µm range where the insulating phase of VO2 also has relatively low optical loss. It is anticipated that the refractive‐index datasets from this article will be broadly useful for modeling and design of VO2‐based optical and optoelectronic components, especially in the mid‐wave and long‐wave infrared.

physics, multidisciplinary
Application of Spectrophotometry in the Process Parameters Determination of Compound Semiconductor Film

Yang Liubin,Jiang Suhua,Hao Maosheng,Li Yuesheng

DOI: https://doi.org/10.13290/j.cnki.bdtjs.2009.04.011

2009-01-01

Abstract:Multi-component and film thickness of compound semiconductor are key process parameters which will directly affect the optical and electrical properties of the device and therefore are very important in the process monitoring and control in optoelectronic device manufacturing.Spectrophotometry and Forouhi-Bloomer dispersion equations were introduced to calculate the film thickness d and the refractive index n of the compound semiconductor.By analyzing with the theoretical n,the elemental component x was determined.SIMS and XRD measurements verified the experimental results.For the fast and nondestructive reflectance measurement and the accurate component determination,this technology can be applied to the industrial online process control and improvement.
Optical properties of vanadium dioxide thin film in nanoparticle structure

baoying fang,yi li,guoxiang tong,xiaohua wang,meng yan,qian liang,feng wang,yuan qin,jie ding,shaojuan chen,jiankun chen,hongzhu zheng,wenrui yuan

DOI: https://doi.org/10.1016/j.optmat.2015.05.027

IF: 3.754

2015-01-01

Optical Materials

Abstract:The thermo-optic effect and infrared optical properties of VO2 nanoparticles were studied to obtain an optical material with special property that can be used in smart windows. The reflectance and transmittance spectra of the VO2 nanoparticles with different duty cycles at different temperatures were simulated with a specific dispersion relation. Vanadium metal nanoparticles were deposited on glass substrate by magnetic reactive sputtering with porous alumina template (MO) mask, and the VO2 nanoparticles were prepared by thermal oxidation. The nanostructure and optical properties of the VO2 nanoparticles were characterized by atomic force microscopy, X-ray photoelectron spectroscopy, X-ray diffraction, and spectrophotometry. The method of preparation of the sample is economical and the phase transition temperature is observed to drop to 43 degrees C. The transmission at 1700 nm exhibits a variation of 29% between the metallic and semiconducting states. The VO2 nanoparticles exhibit a significant thermochromic property. The transmittance of the VO2 nanoparticles is improved compared with the VO2 film. The decrease in phase transition temperature and the enhancement of optical properties demonstrate that VO2 film in nanoparticle structure is a viable candidate material for smart windows. (C) 2015 Elsevier B.V. All rights reserved.
Comparison and Analysis on Measurement of Optical Parameters of Some Semiconductor Films by Two Methods

J Li,FX Gan

DOI: https://doi.org/10.1117/12.371158

1999-01-01

Abstract:The optical parameters of GeTe and Ge2Sb2Te5 semiconductor films by thermal treatment have been measured carefully by using a new method. A compared study by means of using a spectrum ellipsometer is presented. The optical parameters of the sample films are precisely obtained through the processes of data simulation and correction of the old calculation model. In the meantime, the data calculations of the same samples measured by a spectrum ellipsometer are given, and the complex refractive index curves of them in the spectrum range from 250nm to 830nm are obtained.
Spectroscopic ellipsometry and its applications in the study of thin film materials

Xu-dan ZHU,Rong-jun ZHANG,Yu-xiang ZHENG,Song-you WANG,Liang-yao CHEN

DOI: https://doi.org/10.3788/CO.20191206.1195

IF: 1.1

2019-01-01

Chinese Optics

Abstract:Spectroscopic ellipsometry is used to measure the relative amplitude and phase change of linearly polarized light reflected by a material surface, so as to obtain the ellipsometric parameters. The optical properties of a material can be deduced by fitting these parameters. This technique is advantageous for being non-contact, highly sensitive, non-destructive, so it is widely used in physics, chemistry, materials science and microelectronics, etc, being an indispensable optical measurement method. This article first introduces the development history of the technology, and then presents the basic principle of the traditional ellipsometer. According to different measurement principles, ellipsometers can be divided into two types : extinction and photometric. The basic structure, measurement principle and related application of these two different types of ellipsometer are briefly clarified. After comparing these various ellipsometers, their advantages and disadvantages are introduced. At this point, a double Fourier transform infrared ellipsometry system developed by Fudan University is highlighted. Then, according to the basic steps of ellipsometric parameter manipulation, a measurement, modeling and fitting process is introduced. The equations of various optical dispersion models used for parameter fitting are introduced in detail and application examples are illustrated. Finally, the future development direction of spectroscopic ellipsometry is proposed.
Investigation on the Electro-optic Properties and the Relaxation of Electric Poled Dye Doped Polymer Films

Zhiling Xu,Liying Liu,Xiu Liu,Zhanjia Hou,Lei Xu,Wencheng Wang,Mingxin Ye

DOI: https://doi.org/10.3321/j.issn:0258-7025.2000.08.017

2000-01-01

Abstract:Elliptical reflection method was used to measure the electro-optic coefficient of doped α′-cyano-4′-nitro-4-N, N-dimethylstibene (CNDS)/PMMA films. The decay of electro-optic signal of the CNDS/PMMA films with an coated Al electrode was measured in situ. A slow relaxation process was observed in the first few hours of the decay.
Determination of Optical Parameters of Films of PVA/TiO2/SiC and PVA/MgO/SiC Nanocomposites for Optoelectronics and UV-Detectors

H. Ahmed,A. Hashim,H. M. Abduljalil

DOI: https://doi.org/10.15407/ujpe65.6.533

2020-06-09

Ukrainian Journal of Physics

Abstract:The optical properties of polyvinyl alcohol (PVA)–titanium oxide (TiO2)–silicon carbide (SiC) and (PVA)–magnesium oxide (MgO)–(SiC) nanocomposites are calculated, by using the Gaussian 09 and Gaussian view 5.0.8 programs on the basis of the density functional theory at B3LYP level with 6–31 G basis set. The results indicate that the absorbance, absorption coefficient, extinction coefficient, refractive index, imaginary and real dielectric constants, and optical conductivity of (PVA–TiO2–SiC) and (PVA–MgO–SiC) increase with the concentration of SiC nanoparticles. Both nanocomposites have high absorbance in the UV region and have indirect energy gaps 1 eV < Eg < 2.2 eV. This makes them useful for various applications in optoelectronics, photovoltaics, lasers, solar cells, sensors, photocatalytic devices, light filters, UV detectors, etc. with low cost, easy fabrication, and adaptability as compared with other devices.
Electrodynamics of the vanadium oxides VO2 and V2O3

M. M. Qazilbash,A. A. Schafgans,K. S. Burch,S. J. Yun,B. G. Chae,B. J. Kim,H. T. Kim,D. N. Basov

DOI: https://doi.org/10.48550/arXiv.0803.2739

2008-03-19

Strongly Correlated Electrons

Abstract:The optical/infrared properties of films of vanadium dioxide (VO2) and vanadium sesquioxide (V2O3) have been investigated via ellipsometry and near-normal incidence reflectance measurements from far infrared to ultraviolet frequencies. Significant changes occur in the optical conductivity of both VO2 and V2O3 across the metal-insulator transitions at least up to (and possibly beyond) 6 eV. We argue that such changes in optical conductivity and electronic spectral weight over a broad frequency range is evidence of the important role of electronic correlations to the metal-insulator transitions in both of these vanadium oxides. We observe a sharp optical transition with possible final state (exciton) effects in the insulating phase of VO2. This sharp optical transition occurs between narrow a1g bands that arise from the quasi-one-dimensional chains of vanadium dimers. Electronic correlations in the metallic phases of both VO2 and V2O3 lead to reduction of the kinetic energy of the charge carriers compared to band theory values, with paramagnetic metallic V2O3 showing evidence of stronger correlations compared to rutile metallic VO2.
Phase identification of vanadium oxide thin films prepared by atomic layer deposition using X-ray absorption spectroscopy

Yejin Kim,Gwang Yeom Song,Raju Nandi,Jae Yu Cho,Jaeyeong Heo,Deok-Yong Cho

DOI: https://doi.org/10.1039/d0ra04384b

IF: 4.036

2020-01-01

RSC Advances

Abstract:X-ray absorption spectroscopy reveals the local structures of atomic-layer-deposited vanadium oxide films subject to heat treatments.

chemistry, multidisciplinary
Preparation and Optical Properties of Phase-Change VO 2 Thin Films

Lisong Hou

DOI: https://doi.org/10.1007/bf00367579

IF: 4.5

1993-01-01

Journal of Materials Science

Abstract:In this work, VO2 thin films were prepared on three kinds of substrates by the sol-gel dipcoating method followed by heat treatment under vacuum. These thin films were analysed by x-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) techniques. The infrared and ultraviolet-visible spectra of the VO2 thin films were also recorded during heating and cooling between room temperature and 100°C. The experimental results show that VO2 thin films thus prepared exhibit thermally induced reversible phase transition, and the largest changes in transmittance and reflectivity are approximately 58 and 25%, respectively, in the case of vacuum heat treatment at 400°C and silica glass substrates. The refractive index (n) decreases and the absorption coefficient (k) increases when heating these thin films from room temperature to 100°C, and vice versa for cooling. The reasons why the optical constants and infrared absorption spectra change so remarkably are discussed.
Optical Properties of V2O5 Thin Films on Different Substrates and Femtosecond Laser-Induced Phase Transition Studied by Pump-Probe Method

Yu Lan,Guowen Yang,Yangping Li,Yuheng Wang,Qianqian Shi,Guanghua Cheng

DOI: https://doi.org/10.3390/nano12030330

2022-01-21

Abstract:Vanadium pentoxide can undergo a reversible phase transition by heating above 260 °C; its non-thermal phase transition, as well as ultrafast dynamical processes, is still not known. Here, femtosecond laser-induced phase transition properties in V2O5 thin films were first explored using femtosecond time-resolved pump-probe spectroscopy. The results show that the phase transient processes occur on a 10-15-10-13 temporal scale. The phase transition and recovery properties are dependent on both the substrates and pump laser energy densities. We propose the oxygen vacancies theory to explain the results, and we provide valuable insights into V2O5 films for potential applications.
Preparation and Infrared Optical Properties of VO2 Nano Array

Yan Meng,Li Yi,Fang Baoying,Liang Qian,Ding Jie,Wang Feng,Qin Yuan,Tong Guoxiang,Wang Xiaohua,Chen Shaojuan,Chen Jiankun,Zheng Hongzhu,Yuan Wenrui

2014-01-01

Rare Metal Materials and Engineering

Abstract:The thermo-optic effect and infrared optical properties of VO2 nano array were studied in order to obtain high quality optical material widely used in the field of smart windows. Reflectance and transmittance spectra of VO2 nano array at different duty ratios were calculated with a modificatory Sellmeier dispersion model and equivalent refractive index of two-dimensional periodic structure. The vanadium nano array was deposited on the glass substrate by magnetic reactive sputtering with the mask of porous alumina, and then VO2 nano array was formed by annealing under air condition. Its microstructure and optical properties were characterized by atomic force microscope (AFM), X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD) and spectrophotometer. The results show that the phase transition temperature of VO2 nano array with duty ratio 0.83 drops to 43 degrees C and its optical contrast between the metallic and semiconducting states at 1700 nm is 29%, which exhibits a significant thermochromic property. Contrast to VO2 film, the transmittance of VO2 nano array has been noticeably improved. The decrease of phase change temperature and enhancement of optical properties demonstrate that VO2 nano array with decent duty ratio is a competitive candidate material for smart windows.
Electro-Optic And Photorefractive Properties Of Doped Poly (N-Vinylcarbazole)

Sf Wang,Zw Huang,Zj Chen,Qh Gong,Zj Zhang,Hy Chen

DOI: https://doi.org/10.1088/0256-307X/14/6/021

1997-01-01

Chinese Physics Letters

Abstract:In this work, 100 mu m-thick doped poly (N-vinylcarbazole) films with different contents of the electro-optic (EO) chromophore 2,5-dimethyl-4-(p-nitrophenylazo) anisole and plasticizer N-methylcarbazole were prepared and sandwiched between two indium-tin oxide-covered glass substrates. Their EO measurements and two-beam-coupling experiments were performed by using a single mode (TEM00) He-Ne laser. Both the EO coefficient and the gain for two-beam-coupling were found to be strongly depending on the content of plasticizer.
The on line spectrum measurement in the preparation of thin film

Longjian Liu,Jie Shen,Zhuangjian Zhang

DOI: https://doi.org/10.3321/j.issn:1000-3290.2000.02.025

2000-01-01

Abstract:The variation of the film composition can be monitored by using the method of spectrum analysis during the film deposition (for the intensity of the persistent line is proportional to the particle density of the element in the vacuum chamber). The measurement of the transmission spectrum of the film on a transparent substrate can be used to calculate the film parameters, such as refractive index, extinction coefficient and the thickness of the film. Therefore, the combination of the two methods would be helpful to on line monitoring the film constituents and the optical paramenters in the preparation of thin films.

Measurement And Analysis Of The Optical Parameters Of Two Type Dye Films

APPLICATION AND OPTICAL PROPERTIES OF TiO_2 THINFILMS PREPARED BY CHEMICAL VAPOUR DEPOSITION

Determination of the optical constants of polymer light-emitting diode films from single reflection measurements

The Research of a Method to Obtain the Optical Parameters of Semiconductor Films

THE THERMAL OPTICAL PROPERTIES OF POLY (METHYL METHACRYLATE) SOLID FILMS DOPED BY AZO DYES

Optical recording performance of thin films of phthalocyanine compounds

MEASUREMENT OF OPTICAL PARAMETERS OF PHTHALOCYANINE LB FILMS AND SPIN-COATED FILMS

On the Optical Properties of Thin‐Film Vanadium Dioxide from the Visible to the Far Infrared

Application of Spectrophotometry in the Process Parameters Determination of Compound Semiconductor Film

Optical properties of vanadium dioxide thin film in nanoparticle structure

Comparison and Analysis on Measurement of Optical Parameters of Some Semiconductor Films by Two Methods

Spectroscopic ellipsometry and its applications in the study of thin film materials

Investigation on the Electro-optic Properties and the Relaxation of Electric Poled Dye Doped Polymer Films

Determination of Optical Parameters of Films of PVA/TiO2/SiC and PVA/MgO/SiC Nanocomposites for Optoelectronics and UV-Detectors

Electrodynamics of the vanadium oxides VO2 and V2O3

Phase identification of vanadium oxide thin films prepared by atomic layer deposition using X-ray absorption spectroscopy

Preparation and Optical Properties of Phase-Change VO 2 Thin Films

Optical Properties of V2O5 Thin Films on Different Substrates and Femtosecond Laser-Induced Phase Transition Studied by Pump-Probe Method

Preparation and Infrared Optical Properties of VO2 Nano Array

Electro-Optic And Photorefractive Properties Of Doped Poly (N-Vinylcarbazole)

The on line spectrum measurement in the preparation of thin film