Submicron particle sizing by method of segmental autocorrelation dynamic light scattering

Jianwen Yang,Feng Li,WeiJian Tian,Zukang Lu,Zhengkang Bao
1998-01-01
Abstract:The principle of particle sizing by the method of dynamic light scattering is reviewed. By analyzing the relative error, the method of segmental autocorrelation is presented. The problems of high speed and large amount data acquisition are solved. The accuracy of correlation function is not affected seriously. The measuring results are in good agreement with the nominal values.
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