Study of SrS(Eu, Sm) electron-trapping thin film used in optical storage and information processing

Hao Ruan,Shuchun Chen,Zujie Fang,Gendi D. Cao,Gaoting Chen,Fengmei Dai,Fuxi Gan,
1998-01-01
Abstract:The properties of SrS(Eu, Sm) electron-trapping thin film grown by electron beam evaporation are studied. The X-ray diffraction pattern, microstructure measured by atomic force microscopy, optical spectra and the stored image are presented. The results show that the electron-trapping thin film has good optical properties and can be used in optical storage and information processing.
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