Theoretical and experimental study of laser detecting technique for micro bulk defects in silicon

Jun Chen,Zheng You,Zhaoying Zhou,XingZhan Liu
1997-01-01
Abstract:A novel way of laser detection based on generalized Lorenz and Mie scattering theory was developed, which can detect micro bulk defects in Si material. Its principle was analyzed and a method of characteristics extracting was put forward to determine the size of ��m/nm degree bulk defects. Simulating experiments on computer and glass samples were implemented and scattered graph collected in the direction perpendicular to the incident light was processed. The results demonstrate that the scattering modeling and technique are correct and feasible.
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