System Level Test Generation And Fault Simulation For Vlsi Circuits

Yh Ma,Yh Sun,Hy Chen
DOI: https://doi.org/10.1109/icasic.1996.562836
1996-01-01
Abstract:This paper presents a new concept in VLSI test domain: System Level Test Generation and Fault Simulation. In the paper, we describe the process of VLSI circuit design, discuss abstraction of information processed by the circuit, and address the outline of system level test generation and fault simulation.
What problem does this paper attempt to address?