Novel profilometry with projecting grating

Feng Tian,Hong Zhao,Wenyi Chen,Jian Zhou,Yushan Tan
1996-01-01
Abstract:A novel optical whole-field profilometry was presented. In the optical whole-field profilometry, a new kind of moire fringe projector controlled by computer was used for changing the spatial frequency to adapt the contour of the object to be measured. Besides, a method named two times measurement with different precision was proposed in order to measure an object with sudden surface changes. An example of measurement performed by using two gratings with different periods was given out.
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