Stabilization of Face-Centered-cubic Mn Films Via Epitaxial Growth on GaAs(001)

X JIN,M ZHANG,GS DONG,M XU,Y CHEN,X WANG,XG ZHU,XL SHEN
DOI: https://doi.org/10.1063/1.112466
IF: 4
1994-01-01
Applied Physics Letters
Abstract:The epitaxial growth of fcc Mn films on the GaAs(001) surface has been achieved. The films are studied by in situ reflection high energy electron diffraction (RHEED) and ex situ x-ray diffraction (XRD). The lattice parameters of the metastable Mn films are determined to be 0.362 nm. A transition region composed of a Mn-Ga-As alloy is formed at the Mn/GaAs interfaces and is clearly verified by XRD measurements.
What problem does this paper attempt to address?