Abstract:Physical properties of ZnO thin films are of great importance for their potential application. In this paper, we reported the electrical and optical properties of undoped ZnO films with a high dependence oil the nucleation and growth kinetics. These ZnO films were deposited on glass substrates within the temperature range of 250-350 degrees C by pulsed-spray evaporation chemical vapor deposition (PSE-CVD). X-ray diffraction (XRD) shows that ZnO films grow in the c-axis orientated hexagonal structure. The inspection of the surface morphology with scanning electron micrographs (SEM) shows a substantial effect of the growth temperature, which was directly correlated with the nucleation kinetics. A comprehensive nucleation and growth process was also proposed for the interpretation of changeable film morphology and corresponding electrical conductivity. The films deposited at intermediate growth temperatures of 310-340 degrees C show compact structures and consequent high electrical conductivity, Which Was Still improved with increase of film thickness. Ill contrast to the electrical conductivity, the optical hand gal) rather shows a correlation with the size of the crystals forming the films rather than with their arrangement. The band gap energy decreases from 3.56 to 3.42 eV toward the bulk value Upon the increase of the crystallite size from 15 to 30 nm.

A Study on the Evolution of Dielectric Function of Zno Thin Films with Decreasing Film Thickness

Effect of Nucleation and Growth Kinetics on the Electrical and Optical Properties of Undoped ZnO Films

Effect of Solution Concentrations on Crystal Structure, Surface Topographies and Photoluminescence Properties of ZnO Thin Films

Microstructure, surface morphology and optical properties of Na x Cu y Zn 1− x − y O thin films

Effect of Na Concentrations on Microstructure and Optical Properties of Zno Films

Effect of Cu Concentration on Optical Properties of Zn1-xCuxO Thin Films

The Thickness-Dependent Band Gap and Defect Features of Ultrathin ZrO2 Films Studied by Spectroscopic Ellipsometry.

Optical properties of ultrathin ZnO films fabricated by atomic layer deposition

Thickness-Dependent Optical Constants and Annealed Phase Transitions of Ultrathin Zno Films

Optical Properties of Sub-30 Nm-Thick ZnS Films Studied by Spectroscopic Ellipsometry

Evolution of optical properties and electronic structures: band gaps and critical points in Mg<sub>x</sub>Zn<sub>1−x</sub>O (0 ≤ <i>x</i> ≤ 0.2) thin films

Effect of Film Thickness on Properties of Al-Doped Zno Film As Transparent Conducting Electrodes in Oleds

Spectroscopic Ellipsometry Studies on ZnCdO Thin Films with Different Cd Concentrations Grown by Pulsed Laser Deposition

Revisiting The Low-Temperature Dielectric Properties Of Zno

Structural, Electrical, and Optical Properties of ZnInO Alloy Thin Films

Evolution Of Optical Properties And Electronic Structures: Band Gaps And Critical Points In Mgxzn1-Xo (0 X 0.2) Thin Films

Piezoelectricity and Electronic Structures of ZnO Thin Films: A Density Functional Theory Study

Optical Property of Zn Derived from Reflection Electron Energy Loss Spectra

Effects of Film Thickness and Preferred Orientation on the Dielectric Properties of (Bi1.5zn0.5)(zn0.5nb1.5)o-7 Films

Thickness dependence of PbZr0.52Ti0.48O3 thin film ferroelectric parameters

The Investigation of Ellipsometry and DLTS Characteristic for the ZnO Films