Magnetization in Thin Film Inferred by Full-Field Curvatures Based on Cantilever Beam Technique

Xuelin Dong,Xue Feng,Keh-Chih Hwang
DOI: https://doi.org/10.1016/j.ndteint.2014.01.002
IF: 4.683
2014-01-01
NDT & E International
Abstract:The cantilever beam magnetometer is able to measure the magnetization of the magnetic film by the substrate curvature. The conventional formula is derived based on the assumption that the curvature is uniform. In this letter we demonstrate that the uniform bending moment caused by magnetization will lead to non-uniform substrate curvature, and the relationship between the non-uniform curvature and the film magnetization is proposed. It is able to detect the defect in the magnetic film if the magnetization obtained is not uniform. Besides, the effects of the thickness ratio and elastic constants of the film and substrate on the curvature are also analyzed.
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