The Electrical and Morphological Properties of Magnesium Oxide/alumina Bilayered Thin Films Prepared by Electron Beam Evaporation at Oblique Incidence

Li-jun He,Chuan Li,Xing-zhao Liu
DOI: https://doi.org/10.1016/j.apsusc.2013.12.030
IF: 6.7
2014-01-01
Applied Surface Science
Abstract:The electrical and morphological properties of magnesium oxide (MgO)/alumina (Al2O3) bilayered thin films prepared by electron beam evaporation at oblique incidence are reported. The MgO thin films are deposited when the incline angle is 55 degrees on various Al2O3 thin films incline angles. A columnar grain with a roofing-tile-shaped surface is observed in these MgO/Al2O3 thin films. X-ray pole figures and theta-2 theta scan, omega-scan are used to characterize in-plane and out-of-plane textures. The relationships between omega-FWHM, capacitor, leakage current, and the inclined angles are studied. The morphology is investigated by using scanning electron microscope (SEM). So the oblique angle deposition method is an effective way to control the microstructure of thin films. (C) 2013 Elsevier B.V. All rights reserved.
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