Realizing A Family of Transition-Metal-Oxide Memristors Based on Volatile Resistive Switching at A Rectifying Metal/Oxide Interface

M. Yang,N. Qin,L. Z. Ren,Y. J. Wang,K. G. Yang,F. M. Yu,W. Q. Zhou,M. Meng,S. X. Wu,D. H. Bao,S. W. Li
DOI: https://doi.org/10.1088/0022-3727/47/4/045108
2013-01-01
Abstract:There is strong interest in creating new memristors due to their significant impact in many fields including digital information systems, analogue circuits and artificial neural networks as a new class of fundamental electronic elements. Here we report a volatile resistive switching effect at a prototypical Schottky metal/oxide interface and realize a family of transition-metal-oxide memristors showing distinct hysteresis characteristics based on the interface. The results not only provide further understanding on the electrical behaviour of metal/oxide interfaces but also indicate the key role of metal/oxide interfaces as basic building blocks in transition-metal-oxide memristors.
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