Abstract:Two key technologies in electronics industry are chip technology and packaging technology. Solder plays a crucial role in the assembly and interconnection in the electronic packaging industry. As a joint material, solder provides electronic, thermal and mechanical continuity. The eutectic Sn-Pb alloy has been widely used in surface mount technology (SMT) for the interconnection and mechanical support between electronic components and printed circuit boards (PCB). During the last decades, there have been strong worldwide environmental movements towards "green" non-toxic electronic products. Initiatives and legislation forced the electronics industry to replace lead containing products with more environmental friendly, lead free products. Sn-Zn solder system is therefore a promising candidate, recommended for its low melting temperature, around 200°C, which is close to the melting temperature of the traditional binary tin lead solder. But the low cycle fatigue data of Sn-Zn solder system has not been reported yet and the lack of reliability data is one of the barriers to the application of the Sn-Zn system solder alloy. The aim of the present work is to investigate the low cycle fatigue behaviour of the lead-free Sn-8Zn-3Bi solder joint using lap shear test samples. Finite element simulation is presented and the Coffin-Mason equation for Sn-8Zn-3Bi solder joint is given based on the experimental and simulation results: Nf = 0.0294 ()-2.833 Where the Nf is the number of cycles to failure and  is the plastic shear strain. Another important issue, related to reliability of solder joints that has been investigated in this work, is the intermetallic compounds (IMCs). Generally, the interconnection by the solder joint is completed by the formation of IMCs at the interface and the reliability of the whole package is affected by IMCs due to their inherent brittle nature and tendency to generate structural defects. The interfacial reaction of Sn-3.5Ag and Sn-4.0Ag-0.5Cu solders on Au/electroless Ni metallization after high temperature storage (HTS) testing at 150°C is investigated for the reliability of electronic production from the metallurgical viewpoint in this work. It is noticed that Ni3Sn4 intermetallic compounds (IMCs) are found in the Sn-Ag system, while two kind of interfacial productions that are (Ni,Cu)3Sn4 IMC layer and (Cu,Ni)6Sn5 spalling compound gains exists in the Sn-Ag-Cu system. Kirkendall voids are found in both lead free solder joints and clear gap exists at the interface for the case of Sn-Ag solder joint after 1000 hour aging.

Random Vibration Reliability of BGA Lead-Free Solder Joint

Experimental and Statistical Study of the Fracture Mechanism of Sn96.5Ag3Cu0.5 Solder Joints via Ball Shear Test

Experimental and finite element analysis on determining the fatigue life of pb-free solder joint (Sn-0.5Cu-3Bi-1Ag) used in electronic packages under harmonic loads

Predicting fatigue life of Solder joint with submodel method for a BGA package

Reliability of Lead-Free Solder Interconnections in Thermal and Power Cycling Tests

Survey on Fatigue Life Prediction of BGA Solder Joints

Fatigue life prediction of BGA solder joint of several alloy compositions under an isothermal harmonic vibration

Shock fatigue damage failure boundary study of BGA solder joints based on shock response spectrum

Failure and Failure Characterization of QFP Package Interconnect Structure under Random Vibration Condition.

Random Vibration Fatigue Life Prediction of Nano-Silver Solder Joint

Reliability of lead-free fine pitch BGA under thermal and mechanical impact

Study of Package-on-Package Solder Joints under Random Vibration Load Based on Patran

Low Cycle Fatigue Reliability and Interfacial Reaction of Lead-free Solder Joints for Electronic Packaging

Reliability Optimisation and Lifetime Modelling of micro-BGA Assemblies in Harsh Environment Applications

Optimization of the Boundary Conditions of a Board Level Reliability Test Board to Maximize the Fatigue Life of Ball Grid Array Solder Joints under Thermal Cycling and Random Vibration

Fatigue Life Prediction of a Board-Level Assembly for Random Vibrations

Reliability Evaluation of Board-Level Flip-Chip Package under Coupled Mechanical Compression and Thermal Cycling Test Conditions

Effect of Stiffening the Printed Circuit Board in the Fatigue Life of the Solder Joint

Finite element method and experimental study on life prediction of lead-free BGA solder joints using an energy-based approach

New Reliability Assessment Method for Solder Joints in BGA Package by Considering the Interaction between Design Factors

A novel shock life model for BGA solder joints based on evolutionary power spectral density