A Novel Switched Capacitor Bandgap Reference with a Correlated Double Sampling Structure

Chen Jianguang,Hao Yueguo,Cheng Yuhua
DOI: https://doi.org/10.1088/1674-4926/34/2/025009
2013-01-01
Journal of Semiconductors
Abstract:A switched capacitor bandgap voltage reference with correlated double sampling structure embedded in a temperature sensor is implemented in a standard 0.35μm CMOS process.Due to the smaller change of the op-amp’s output voltage,this topology is very suitable for low power applications.In addition,errors caused by the finite op-amp gain,input offset voltage,and 1/f noise are eliminated with the correlated double sampling technique.Additionally,two-level process calibration techniques are designed to minimize the process spread. Finally,a method of getting a full period valid reference voltage output is discussed and experimental results are provided to verify the effectiveness of the proposed structure.
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