Fabrication and Characterization of Nano/amorphous Dual-Phase FINEMET Microwires

H. Wang,F. X. Qin,D. W. Xing,F. Y. Cao,H. X. Peng,J. F. Sun
DOI: https://doi.org/10.1016/j.mseb.2013.09.010
2013-01-01
Abstract:A nano/amorphous dual-phase FINEMET microwire was fabricated directly from molten alloy without any interstage annealing by a home-built melt extraction technique (MET). The microstructure, mechanical and pronounced electromagnetic interference shielding (EMI) effectiveness of this dual-phase microwire has been systematically evaluated. The structural analysis reveals that the as-cast FINEMET microwire consists of two distinct structures, i.e., amorphous and nanocrystalline phase due to their different cooling characteristics. Compared with other reported FINEMET alloys, the extracted microwire exhibits a superior high tensile strength of 1800 MPa. These nanocrystals enabled dual-phase microwires also exhibit large EMI SE values in the frequency range of 8-12 GHz (X-band) due to the multiple magnetic loss mechanisms associated with their intrinsic structural characteristics. The combination of excellent mechanical properties and electromagnetic properties make this kind of melt-extracted dual-phase FINEMET microwire promising for a range of structure and multifunctional applications. (C) 2013 Elsevier B.V. All rights reserved.
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