Dramatic Reduction of Fmr Linewidth in Epitaxial Pb(Zrti)O (3)-Nife2o4 Nanocomposite Films

Feiming Bai,Guo Yu,Yicheng Wang,Lichuan Jin,Zhiyong Zhong,Huaiwu Zhang,Fei Ye
DOI: https://doi.org/10.1109/tmag.2013.2243411
IF: 1.848
2013-01-01
IEEE Transactions on Magnetics
Abstract:Self-assembled nanocomposite Pb(Zr-0.52 Ti-0.48)O-3-NiFe2O4 films have been grown on the (001)-oriented MgAl2O4 substrate by a 90 degrees off-axis magnetron sputtering method. X-ray diffraction shows that both Pb(ZrTi)O-3 and NiFe2O4 phases are epitaxial with a 1-3 dimensional embedding composite structure. The vertical lattice mismatch between the Pb(ZrTi)O-3 and NiFe2O4 phase is only 0.65%, indicating almost perfect matching of both phases and low defect concentration. Magnetization measurement shows that the coercive field is 274 Oe and linear extrapolation of the in-plane magnetization yields a uniaxial anisotropy field of similar to 1.3 kOe for a 1200 nm-thickness sample. The peak-to-peak ferromagnetic resonance (FMR) linewidth of the film is about 271 Oe, therefore, suitable for nonreciprocal RF/microwave devices.
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