Measurement of the Third Order Intercept Point for a Photodiode Using Two Maximum-Biased MZM

Shangyuan Li,Xiaoping Zheng,Hanyi Zhang,Bingkun Zhou
DOI: https://doi.org/10.1364/cleo_at.2013.jtu4a.90
2013-01-01
Abstract:We proposed a simple method to measure the third-order intercept point for a photodiode using two-tone and two maximum-biased MZM. The measured IP3 of 16.04dBm agreed with that measured using traditional three-tone setup.
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