Nonvolatile Resistive Memory Devices Based on Ag

Zhiwen Jin,Guo Liu,Jizheng Wang
DOI: https://doi.org/10.1039/c3tc30387j
IF: 6.4
2013-01-01
Journal of Materials Chemistry C
Abstract:Ag-based nonvolatile resistive memory devices are fabricated with the help of a simple soft-chemical process, which can transform Ag film into Ag2S/Ag nano-flake film. A very high ON/OFF ratio of 2.35 x 10(8) and satisfactory retention time of larger than 10(4) s are achieved. The redox reaction Ag+ (Ag2S) + e(-) -> Ag at the Ag2S/Ag interface induced the filamentary conduction that is responsible for the observed memory effects.
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