Microchannel plate photon counting detector in UV range

卜绍芳 BU Shao-fang,尼启良 NI Qi-liang,何玲平 HE Ling-ping,张宏吉 ZHANG Hong-ji,刘世界 LIU Shi-jie

DOI: https://doi.org/10.3788/co.20120503.0302

IF: 1.1

2012-01-01

Chinese Optics

Abstract:A Microchannel Plate（MCP） photon detector was developed to detect the 30.4 nm radiation in a plasma layer of the earth.By changing voltages,temperatures and other parameters,the variations of the dark noise and resolution for the MCP detector were compared.The results indicate that the dark noise of the detector comes from the ion feedback of residual gas and the thermal noises mainly.Therefore,to reduce the dark noise,the microchannel should be preprocessed by removing residual gases and the detector could not work at a high temperature state.After preprocessing at the room temperature,the dark noise counting rate of the detector has reduced to 0.34 count/s·cm2.Furthermore,the temperature has a little effect on the resolution of the detector,and the resolution dependents on the variances of voltage or counting rate obviously.With different resist pressure abilities for different MCPs,it demonstrates that the proper voltage or counting rate can provide a better resolution.