Advancing Ultraviolet Detector Technology for future missions: Investigating the dark current plateau in silicon detectors using photon-counting EMCCDs

Aafaque R. Khan,Erika Hamden,Gillian Kyne,April D. Jewell,John Henessey,Shouleh Nikzad,Vincent Picouet,Olivia Jones,Harrison Bradley,Nazende Kerkeser,Zeren Lin,Brock Parker,Grant West,John Ford,Frank Gacon,Dave Beaty,Jacob Vider

DOI: https://doi.org/10.48550/arXiv.2407.15392

2024-07-22

Abstract:Understanding the noise characteristics of high quantum efficiency silicon-based ultraviolet detectors, developed by the Microdevices Lab at the Jet Propulsion Laboratory, is critical for current and proposed UV missions using these devices. In this paper, we provide an overview of our detector noise characterization test bench that uses delta-doped, photon counting, Electron-multiplying CCDs (EMCCDs) to understand the fundamental noise properties relevant to all silicon CCDs and CMOS arrays. This work attempts to identify the source of the dark current plateau that has been previously measured with photon-counting EMCCDs and is known to be prevalent in other silicon-based arrays. It is suspected that the plateau could be due to a combination of detectable photons in the tail of blackbody radiation of the ambient instrument, low-level light leaks, and a non-temperature-dependent component that varies with substrate voltage. Our innovative test setup delineates the effect of the ambient environment during dark measurements by independently controlling the temperature of the detector and surrounding environment. We present the design of the test setup and preliminary results.

Instrumentation and Methods for Astrophysics,Instrumentation and Detectors

What problem does this paper attempt to address?

The main problem that this paper attempts to solve is to understand the dark current plateau phenomenon in silicon - based ultraviolet detectors, especially this problem encountered when performing photon counting using electron - multiplying charge - coupled devices (EMCCD). Specifically, the researchers hope to identify the reasons why the dark current no longer decreases with the decrease in temperature at low temperatures.

### Research Background
Silicon - based ultraviolet detectors with high quantum efficiency are crucial for future ultraviolet missions. The noise characteristics of these detectors at low temperatures have an important impact on their performance. Normally, the thermal dark current of silicon - based detectors should decrease exponentially with the decrease in temperature, but in actual measurements, it is found that the dark current shows a plateau phenomenon at temperatures below about 160 K, that is, it no longer continues to decrease.

### Main Problems
1. **Dark Current Plateau Phenomenon**: The researchers suspect that the dark current plateau may be caused by environmental factors (such as visible/infrared photons from the instrument's black - body radiation, weak light leakage) or non - temperature - dependent components related to the substrate voltage.
2. **Optimizing Detector Performance**: By understanding the source of the dark current plateau, better operation and system design strategies can be developed to improve the performance of the detector.

### Solutions
To explore the reasons for the dark current plateau, the researchers designed an innovative test platform that can independently control the temperatures of the detector and its surrounding environment. Through this setup, they can more accurately isolate the influence of the environment on the dark current. Specific measures include:
- **Independent Cooling Chains**: Independently control the temperatures of the detector and the surrounding environment.
- **Low - light - leakage Environment**: Ensure that the test environment excludes the interference of external light sources as much as possible.
- **Automated Testing**: Achieve long - term uninterrupted data collection to obtain dark current data under different temperature combinations.

### Preliminary Results
Preliminary results show that in a low - temperature environment (cold - hood configuration), the dark current is significantly lower than that in a normal - temperature environment (warm - hood configuration). This indicates that environmental photons may have an important impact on the dark current plateau. However, further research is still in progress to quantify and confirm these impacts.

### Future Work
The research team will continue to collect data under different substrate voltages and improve data processing methods, especially to correct the image blurring problem caused by the decrease in charge - transfer efficiency (CTE) at low temperatures. In addition, different delta - doped detectors and engineering - level detectors will be tested to verify the universality of these findings.

### Summary
This research aims to provide more optimized detector technologies and operation strategies for future ultraviolet detection tasks through in - depth understanding of the dark current plateau phenomenon.