Role of Measurement Voltage on Hysteresis Loop Shape in Piezoresponse Force Microscopy

E. Strelcov,Y. Kim,J. C. Yang,Y. H. Chu,P. Yu,X. Lu,S. Jesse,S. V. Kalinin
DOI: https://doi.org/10.1063/1.4764939
IF: 4
2012-01-01
Applied Physics Letters
Abstract:The dependence of field-on and field-off hysteresis loop shape in Piezoresponse Force Microscopy (PFM) on driving voltage, Vac, is explored. A nontrivial dependence of hysteresis loop parameters on measurement conditions is observed. The strategies to distinguish between paraelectric and ferroelectric states with small coercive bias and separate reversible hysteretic and non-hysteretic behaviors are suggested. Generally, measurement of loop evolution with Vac is a necessary step to establish the veracity of PFM hysteresis measurements.
What problem does this paper attempt to address?