Fdtd Simulation on Laser-Induced Enhancement of Electric Field in the Near-Field Apertureless Probe System

J. C. Liu,D. M. Liu,T. M. Shao
DOI: https://doi.org/10.7452/lapl.201210012
IF: 1.704
2012-01-01
Laser Physics Letters
Abstract:Laser processing has gained wide-spread use in cutting and drilling at micro scales. However, it is difficult for laser processing to make breakthrough of optical diffraction limit. In this article, a method of surface micro-processing based on laser-induced electric field enhancement in the near-field apertureless probe system is introduced. The enhancement was simulated by using a Finite Difference Time Domain-algorithm-based model. Characters of probe materials, probe geometric characters, laser incident angle and distances between the probe and the substrate were studied in order to understand mechanism of the enhancement. A strong correlation between the intensity and the working parameters was observed, which paves the way to optimize experimental conditions and parameters in the manufacturing process. Due to the strongly-enhanced electric field in laser processing, micrometer and nanometer scale processing can be reached.[GRAPHICS](C) 2012 by Astro, Ltd.
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