Ultrafast study of carrier interaction in bismuth telluride thin film

MA Wei-Gang,Xing Zhang
2012-01-01
Kung Cheng Je Wu Li Hsueh Pao/Journal of Engineering Thermophysics
Abstract:Bismuth telluride, with narrow band gap, large electrical conductivity, large Seebeck coefficient, and low thermal conductivity, is one of the best thermoelectric materials with the highest figure of merit at room temperature. In addition, thin film and superlattice are considered to be the feasible ways to improve the performance of thermoelectric materials. And hence, it is important to study the carrier interaction in bismuth telluride thin film. In this paper, the carrier interaction of 100 nm thick bismuth telluride film deposited on silicon substrate has been studied by applying the femtosecond laser pump-probe transient thermoreflectance technique. Different carrier interaction processes, including electrons excited from valence band to conduction band, electron-hole recombination, and energy coupling from photoexcited carriers to lattice have been studied respectively by changing the delay time step of the probe pulse. Also, an acoustic wave generated from the thermal stress has been observed and the corresponding extracted longitudinal wave velocity is 2649 m s -1.
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