Unsteady Test for Steady-state Temperature Prediction of Power Devices and Accuracy Analysis

Hongcai LI,Feifan CHEN,Yonggui DONG
DOI: https://doi.org/CNKI:11-1929/V.20111228.1818.009
2012-01-01
Abstract:Combined with the temperature variation laws of power electronic devices in unsteady-state heat conduction, time constant and the prediction error of steady-state temperature in different test conditions are measured by unsteady test method. Based on this, a method that using test data both in heating and cooling phases of the power electronic devices is proposed, which can reduce the temperature rise in heating phase effectively. Experimental results show that the temperature increase ratio reaches 70% of the total temperature rise when only using the test data in heating phase to predict the steady-state temperature within the given error of 5%. While, the temperature increase ratio can be reduced to 40% when using the teat data both in heating and cooling phases, and the corresponding test time can be reduced to 1/2 of the former. With the proposed method, the test efficiency can be improved and the impact of testing on the devices can be minimized.
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