Low-Temperature Electrical Resistivity of As-Cast Glassy, Relaxed, and Crystallized Pd40cu30ni10p20 Alloys

JZ Jiang,W Roseker,CS Jacobsen,GF Goya

DOI: https://doi.org/10.1088/0953-8984/15/50/005

2003-01-01

Abstract:Low-temperature (300–4.2 K) electrical resistivity behaviours of as-cast glassy, relaxed, and crystallized Pd40Ni10Cu30P20 alloys have been investigated. It is found that the resistivity of the as-cast glassy alloy is about 257 µΩ cm at ambient temperature and decreases with a temperature coefficient of resistivity (TCR) of 2.1 × 10−4 K−1 in the temperature range of 280–50 K and 89 × 10−4 K−1 in the temperature range of 12–4.2 K. The relaxation effect slightly increases the resistivity by a factor of about 10% while crystallization decreases the resistivity of the alloy. Surprisingly, we found that all samples, as-cast glassy, relaxed, crystallized, and well-crystallized alloys, exhibit similar temperature dependences of the electrical resistivity in the temperature range investigated. TCR changes at around 10–20 K for all samples are linked with rapid increase of the magnetization in the alloys.