A Diode Laser Spectrometer at 634 Nm and Absolute Frequency Measurements Using Optical Frequency Comb

Yi Lin,Yuan Jie,Qi Xiang-Hui,Chen Wen-Lan,Zhou Da-Wei,Zhou Tong,Zhou Xiao-Ji,Chen Xu-Zong

DOI: https://doi.org/10.1088/1674-1056/18/4/021

2009-01-01

Abstract:This paper reports that two identical external-cavity-diode-laser (ECDL) based spectrometers are constructed at 634 nm referencing on the hyperfine B-X transition R(80)8-4 of I-127(2). The lasers are stabilized on the Doppler-free absorption signals using the third-harmonic detection technique. The instability of the stabilized laser is measured to be 2.8 x 10(-12) (after 1000s) by counting the beat note between the two lasers. The absolute optical frequency of the transition is, for the first time, determined to be 472851936189.5 kHz by using an optical frequency comb referenced on the microwave caesium atomic clock. The uncertainty of the measurement is less than 4.9 kHz.