A Method for the Optical Characterization of Thin Uniaxial Samples
F YANG,GW BRADBERRY,JR SAMPLES
DOI: https://doi.org/10.1080/713824417
IF: 1.3
1995-01-01
Journal of Modern Optics
Abstract:An optical characterization procedure for small fragments of uniaxial materials is described involving the simple use of crossed polarizers with one polished face of the material. The reflectance at a fluid-uniaxial slab boundary beyond, but near, the critical angle of incident light is examined for linear incidence polarization using an orthogonal output polarizer. It is found that, as the crossed incident and output polarizers are rotated together, there are, for a given angle of incidence, particular polarization angles for which the reflectivity is a minimum. These angles give information on the optical tenser of the crystal under study. Further the intensity of the reflected light, for incidence angles beyond critical with the input and output polarizers crossed, has as a function of the incident polarization angle an oscillatory form which, when fitted to theory, can also yield the full uniaxial tenser of the material under study. This is confirmed experimentally for a thin single crystal of calcite with one polished face.